Cover of Kunio Takeyasu (EDT): Atomic Force Microscopy in Nanobiology

Kunio Takeyasu (EDT) Atomic Force Microscopy in Nanobiology

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Jenny Stanford Publishing

2016

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978-981-4411-59-2

981-4411-59-0

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Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly

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