Cover of Pavese Franco Pavese (EDT), Baer Markus Baer (EDT), Filtz Jean-remy Filtz (EDT), Forbes Alistair B Forbes (EDT), Pendrill Leslie Pendrill (EDT), Shirono Kastsuhiro Shirono (EDT): Advanced Mathematical And Computational Tools In Metrology And Testing Ix

Pavese Franco Pavese (EDT), Baer Markus Baer (EDT), Filtz Jean-remy Filtz (EDT), Forbes Alistair B Forbes (EDT), Pendrill Leslie Pendrill (EDT), Shirono Kastsuhiro Shirono (EDT) Advanced Mathematical And Computational Tools In Metrology And Testing Ix

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World Scientific Publishing Company

2012

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978-981-4397-96-4

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This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

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