Cover of Jesus Ariel Carrasco-Ochoa (EDT), Jose Francisco Martinez-Trinidad (EDT), Jose Arturo Olvera Lopez (EDT), Kim L. Boyer (EDT): Pattern Recognition

Jesus Ariel Carrasco-Ochoa (EDT), Jose Francisco Martinez-Trinidad (EDT), Jose Arturo Olvera Lopez (EDT), Kim L. Boyer (EDT) Pattern Recognition

4th Mexican Conference, MCPR 2012, Huatulco, Mexico, June 27-30, 2012. Proceedings

Price for Eshop: 1267 Kč (€ 50.7)

VAT 0% included

New

E-book delivered electronically online

E-Book information

Springer Berlin Heidelberg

2012

PDF
How do I buy e-book?

978-3-642-31149-9

3-642-31149-0

Annotation

This book constitutes the refereed proceedings of the 4th Mexican Conference on Pattern Recognition, MCPR 2012, held in Huatulco, Mexico, in June 2012. The 31 revised full papers and 3 keynotes presented were carefully reviewed and selected from 64 submissions and are organized in topical sections on image processing; computer vision and image recognition; pattern recognition and neural networks; and document processing and speech recognition.

Ask question

You can ask us about this book and we'll send an answer to your e-mail.