Cover of Cesar San Martin (EDT), Sang-Woon Kim (EDT): Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications

Cesar San Martin (EDT), Sang-Woon Kim (EDT) Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications

16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, Pucon, Chile, November 15-18, 2011. Proceedings

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Springer Berlin Heidelberg

2011

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978-3-642-25085-9

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This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucon, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.

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