Cover of Wojciech Ziarko (EDT), Yiyu Yao (EDT): Rough Sets and Current Trends in Computing

Wojciech Ziarko (EDT), Yiyu Yao (EDT) Rough Sets and Current Trends in Computing

Second International Conference, RSCTC 2000 Banff, Canada, October 16-19, 2000 Revised Papers

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Springer Berlin Heidelberg

2003

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978-3-540-45554-7

3-540-45554-X

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This book constitutes the thoroughly refereed post-proceedings of the Second International Conference on Rough Sets and Current Trends in Computing, RSCTC 2000, held in Banff, Canada in October 2000.The 80 revised papers presented together with an introduction and three keynote presentations have gone through two rounds of reviewing and revision. The papers are organized in topical sections on granual computing, rough sets and systems, fuzzy sets and systems, rough sets and data mining, nonclassical logics and reasoning, pattern recognition and image processing, neural networks and genetic algorithms, and current trends in computing.

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