Alberto Apostolico (EDT), Maxime Crochemore (EDT), Kunsoo Park (EDT) Combinatorial Pattern Matching

16th Annual Symposium, CPM 2005, Jeju Island, Korea, June 19-22, 2005, Proceedings

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E-Book information

Publisher: Springer Berlin Heidelberg

Date: 2005

EAN/ISBN13: 978-3-540-31562-9

ISBN10: 3-540-31562-4

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