Cover of Tonio Di Battista (EDT), Elias Moreno (EDT), Walter Racugno (EDT): Topics on Methodological and Applied Statistical Inference

Tonio Di Battista (EDT), Elias Moreno (EDT), Walter Racugno (EDT) Topics on Methodological and Applied Statistical Inference

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Springer International Publishing

2016

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978-3-319-44093-4

3-319-44093-4

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This book brings together selected peer-reviewed contributions from various research fields in statistics, and highlights the diverse approaches and analyses related to real-life phenomena. Major topics covered in this volume include, but are not limited to, bayesian inference, likelihood approach, pseudo-likelihoods, regression, time series, and data analysis as well as applications in the life and social sciences.The software packages used in the papers are made available by the authors.This book is a result of the 47th Scientific Meeting of the Italian Statistical Society, held at the University of Cagliari, Italy, in 2014.

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