Cover of Armando J. Pinho (EDT), Petia Georgieva (EDT), Luis F. Teixeira (EDT), Joan Andreu Sanchez (EDT): Pattern Recognition and Image Analysis

Armando J. Pinho (EDT), Petia Georgieva (EDT), Luis F. Teixeira (EDT), Joan Andreu Sanchez (EDT) Pattern Recognition and Image Analysis

10th Iberian Conference, IbPRIA 2022, Aveiro, Portugal, May 4-6, 2022, Proceedings

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Springer International Publishing

2022

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978-3-031-04881-4

3-031-04881-4

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This book constitutes the refereed proceedings of the 10th Iberian Conference on Pattern Recognition and Image Analysis, IbPRIA 2022, held in Aveiro, Portugal, in May 2022. The 54 papers accepted for these proceedings were carefully reviewed and selected from 72 submissions. They deal with document analysis; medical image processing; biometrics; pattern recognition and machine learning; computer vision; and other applications. 

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