Cover of Jesus Ariel Carrasco-Ochoa (EDT), Jose Francisco Martinez-Trinidad (EDT), Jose Arturo Olvera-Lopez (EDT), Joaquin Salas (EDT): Pattern Recognition

Jesus Ariel Carrasco-Ochoa (EDT), Jose Francisco Martinez-Trinidad (EDT), Jose Arturo Olvera-Lopez (EDT), Joaquin Salas (EDT) Pattern Recognition

11th Mexican Conference, MCPR 2019, Queretaro, Mexico, June 26-29, 2019, Proceedings

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Springer International Publishing

2019

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978-3-030-21077-9

3-030-21077-4

Annotation

This book constitutes the proceedings of the 11th Mexican Conference on Pattern Recognition, MCPR 2019, held in Queretaro, Mexico, in June 2019. The 40 papers presented in this volume were carefully reviewed and selected from 86 submissions. They were organized in topical sections named: artificial intelligence techniques and recognition; computer vision; industrial and medical applications of pattern recognition; image processing and analysis; pattern recognition techniques; signal processing and analysis; natural language, and  processing and recognition.

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