Cover of Ravelo Blaise Ravelo (EDT), Xu Zhifei Xu (EDT): Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis

Ravelo Blaise Ravelo (EDT), Xu Zhifei Xu (EDT) Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis

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The Institution of Engineering and Technology

2020

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978-1-83953-050-0

1-83953-050-2

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This book describes a fast, accurate and flexible modelling methodology for PCBs. The model uses the concept of tensorial analysis of networks (TAN) based on Kron's and Kron-Branin's methods adapted for the EMC use by O. Maurice. The TAN approach is applied to the PCB SI and electromagnetic compatibility (EMC) analysis.

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