Cover of Shi Wenzhong (EDT), Bo Wu (EDT), Alfred Stein (EDT): Uncertainty Modelling and Quality Control for Spatial Data

Shi Wenzhong (EDT), Bo Wu (EDT), Alfred Stein (EDT) Uncertainty Modelling and Quality Control for Spatial Data

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CRC Press

2015

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978-1-4987-3334-2

1-4987-3334-4

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Offers New Insight on Uncertainty ModellingFocused on major research relative to spatial information, Uncertainty Modelling and Quality Control for Spatial Data introduces methods for managing uncertainties-such as data of questionable quality-in geographic information science (GIS) applications. By using original research, current advancement, and

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