David J. Weiss (EDT) New Horizon Testing

Latent Trait Test Theory and Computerized Adaptive Testing

Price for Eshop: 1520 Kč (€ 60.8)

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Condition: New

Availability: E-book delivered electronically online

E-Book information

Publisher: Elsevier Science

Date: 2014

Pages: 345

EAN/ISBN13: 978-1-4832-9772-9

ISBN10: 1-4832-9772-1

New Horizon Testing

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