Cover of Uwe Becker (EDT), David A. Shirley (EDT): VUV and Soft X-Ray Photoionization

Uwe Becker (EDT), David A. Shirley (EDT) VUV and Soft X-Ray Photoionization

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Springer US

2012

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978-1-4613-0315-2

1-4613-0315-X

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Leading investigators offer the first comprehensive study of gas phase photoionization research in the VUV and soft X-ray regime since the massive employment of synchrotron radiation as a spectroscopic tool. Chapters cover all aspects of photoionization phenomena from total cross sections to highly differentiated measurements such as coincidence experiments and spin-resolved electron spectroscopy. This work is abundant with illustrations.

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