Cover of Michael Nastasi, James W. Mayer, Yongqiang Wang: Ion Beam Analysis

Michael Nastasi, James W. Mayer, Yongqiang Wang Ion Beam Analysis

Fundamentals and Applications

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CRC Press

2014

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978-1-4398-4639-1

1-4398-4639-1

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Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.The book explains how ions interact with solids

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