Cover of Wai-Kai Chen (EDT): Memory, Microprocessor, and ASIC

Wai-Kai Chen (EDT) Memory, Microprocessor, and ASIC

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CRC Press

2003

EPub
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384

978-1-135-49925-9

1-135-49925-X

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Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons

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