Cover of Xiujian Chou, Wendong Zhang, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li, Chenyang Xue: Measurement Technology for Micro-Nanometer Devices

Xiujian Chou, Wendong Zhang, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li, Chenyang Xue Measurement Technology for Micro-Nanometer Devices

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Wiley

2016

EPub
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978-1-118-71799-8

1-118-71799-6

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A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale Highlights the advanced research work from industry and academia in micro-nano devices test technology Written at both introductory and advanced levels, provides the fundamentals and theories Focuses on the measurement techniques for characterizing MEMS/NEMS devices

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