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Showing books 461-470 from 4273

E-Books - Circuits & components

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Anne van den Bosch, Michiel Steyaert, Willy M.C. Sansen

Static and Dynamic Performance Limitations for High Speed D/A Converters

Price for Eshop: 3647 Kč (€ 145.9)

Format: E-Book, Publisher: Springer US

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Price for Eshop: 2520 Kč (€ 100.8)

Format: E-Book, Publisher: Springer US

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Alberto Bosio (EDT), Daniel Menard (EDT), Olivier Sentieys (EDT)

Approximate Computing Techniques

From Component- to Application-Level

Price for Eshop: 2520 Kč (€ 100.8)

Format: E-Book, Publisher: Springer International Publishing

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Lilian Bossuet (EDT), Lionel Torres (EDT)

Foundations of Hardware IP Protection

Price for Eshop: 2239 Kč (€ 89.6)

Format: E-Book, Publisher: Springer International Publishing

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N. Bouden-Romdhane, Vijay Madisetti, J.W. Hines

Quick-Turnaround ASIC Design in VHDL

Core-Based Behavioral Synthesis

Price for Eshop: 3647 Kč (€ 145.9)

Format: E-Book, Publisher: Springer US

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Assim Boukhayma

Ultra Low Noise CMOS Image Sensors

Price for Eshop: 3365 Kč (€ 134.6)

Format: E-Book, Publisher: Springer International Publishing

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Marc Boule, Zeljko Zilic

Generating Hardware Assertion Checkers

For Hardware Verification, Emulation, Post-Fabrication Debugging and On-Line Monitoring

Price for Eshop: 2520 Kč (€ 100.8)

Format: E-Book, Publisher: Springer Netherlands

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Pierre Boulet (EDT)

Advances in Design and Specification Languages for SoCs

Selected Contributions from FDL'04

Price for Eshop: 3647 Kč (€ 145.9)

Format: E-Book, Publisher: Springer US

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Herve A. Bourlard, Nelson Morgan

Connectionist Speech Recognition

A Hybrid Approach

Price for Eshop: 5055 Kč (€ 202.2)

Format: E-Book, Publisher: Springer US

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Sleiman Bou-Sleiman, Mohammed Ismail

Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Price for Eshop: 1267 Kč (€ 50.7)

Format: E-Book, Publisher: Springer New York

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