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E-Books - Circuits & components

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Rajesh Bordawekar, Bob Blainey, Ruchir Puri

Analyzing Analytics

Price for Eshop: 985 Kč (€ 39.4)

Format: E-Book, Publisher: Springer International Publishing

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Artem Boriskin (EDT), Ronan Sauleau (EDT)

Aperture Antennas for Millimeter and Sub-Millimeter Wave Applications

Price for Eshop: 4492 Kč (€ 179.7)

Format: E-Book, Publisher: Springer International Publishing

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Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky

Dielectric Breakdown in Gigascale Electronics

Time Dependent Failure Mechanisms

Price for Eshop: 1267 Kč (€ 50.7)

Format: E-Book, Publisher: Springer International Publishing

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Bohdan Borowik, Mykola Karpinskyy, Valery Lahno, Oleksandr Petrov

Theory of Digital Automata

Price for Eshop: 2520 Kč (€ 100.8)

Format: E-Book, Publisher: Springer Netherlands

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Dominique Borrione (EDT)

Advances in Design Methods from Modeling Languages for Embedded Systems and SoC's

Selected Contributions on Specification, Design, and Verification from FDL 2009

Price for Eshop: 3647 Kč (€ 145.9)

Format: E-Book, Publisher: Springer Netherlands

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Wolfgang Borutzky

Bond Graph Modelling for Control, Fault Diagnosis and Failure Prognosis

Price for Eshop: 3084 Kč (€ 123.4)

Format: E-Book, Publisher: Springer International Publishing

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Wolfgang Borutzky (EDT)

Bond Graph Modelling of Engineering Systems

Theory, Applications and Software Support

Price for Eshop: 3647 Kč (€ 145.9)

Format: E-Book, Publisher: Springer New York

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N.K. Bose

Multidimensional Systems Theory and Applications

Price for Eshop: 2520 Kč (€ 100.8)

Format: E-Book, Publisher: Springer Netherlands

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Anne van den Bosch, Michiel Steyaert, Willy M.C. Sansen

Static and Dynamic Performance Limitations for High Speed D/A Converters

Price for Eshop: 3647 Kč (€ 145.9)

Format: E-Book, Publisher: Springer US

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Price for Eshop: 2520 Kč (€ 100.8)

Format: E-Book, Publisher: Springer US

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