Cover of Pierre-No l Favennec (EDT), Fr d rique de Fornel (EDT): Measurements using Optic and RF Waves

Pierre-No l Favennec (EDT), Fr d rique de Fornel (EDT) Measurements using Optic and RF Waves

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Wiley

2013

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978-1-118-58629-7

1-118-58629-8

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Scientific and technical knowledge for measurements in modern electromagnetism must be vast as our electromagnetic environment covers all frequencies and wavelengths. These measurements must be applied to fields as varied as nanotechnologies, telecommunications, meteorology, geolocalization, radioastronomy, health, biology, etc. In order to cover the multiple facets of the topic, this book sweeps the entire electromagnetic spectrum, from several hertz to terahertz; considers distances ranging from nanometers to light-years in optics; before extending towards the various measurement techniques using electromagnetic waves for various applications. This book describes these different facets in eleven chapters, each covering different domains of applications.

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